Invention Grant
US08719818B2 Cloud-based test system utilizing cloud systems that include cloud servers to simulate virtual test machines to test an electrical device
有权
基于云的测试系统利用包括云服务器的云系统来模拟虚拟测试机器来测试电气设备
- Patent Title: Cloud-based test system utilizing cloud systems that include cloud servers to simulate virtual test machines to test an electrical device
- Patent Title (中): 基于云的测试系统利用包括云服务器的云系统来模拟虚拟测试机器来测试电气设备
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Application No.: US13278259Application Date: 2011-10-21
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Publication No.: US08719818B2Publication Date: 2014-05-06
- Inventor: Shiang-Jiun Chen , Shang-Lun Chiang , Han-Chao Lee
- Applicant: Shiang-Jiun Chen , Shang-Lun Chiang , Han-Chao Lee
- Applicant Address: TW Taipei
- Assignee: Institute for Information Industry
- Current Assignee: Institute for Information Industry
- Current Assignee Address: TW Taipei
- Agency: McClure, Qualey & Rodack, LLP
- Priority: TW100124798A 20110713
- Main IPC: G06F9/455
- IPC: G06F9/455 ; G06F9/46 ; G06F11/00

Abstract:
A cloud-based test system is disclosed. The cloud-based test system utilizes several cloud systems for testing. Each cloud system includes several cloud servers for providing a cloud resource to simulate several virtual test machines. The cloud-based test system includes several slave servers and a main server. Each slave server corresponds to one of the cloud systems for controlling the corresponding virtual test machines. The main server receives a test instruction, which is utilized to execute a target test item for a target electrical device, from a client, and generates a test environment condition corresponding to the test instruction. The main server determines the virtual test machines for executing the target test item and the at least one server to control the virtual test machines. The main server transmits the test instruction and the corresponding test environment condition to the server slave servers for testing.
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