Invention Grant
US08719959B2 Cantilever, cantilever system, and probe microscope and adsorption mass sensor including the cantilever system
有权
悬臂,悬臂系统,探针显微镜和吸附质量传感器,包括悬臂系统
- Patent Title: Cantilever, cantilever system, and probe microscope and adsorption mass sensor including the cantilever system
- Patent Title (中): 悬臂,悬臂系统,探针显微镜和吸附质量传感器,包括悬臂系统
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Application No.: US12548638Application Date: 2009-08-27
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Publication No.: US08719959B2Publication Date: 2014-05-06
- Inventor: Masatsugu Shigeno
- Applicant: Masatsugu Shigeno
- Applicant Address: JP Chiba
- Assignee: SII Nano Technology Inc.
- Current Assignee: SII Nano Technology Inc.
- Current Assignee Address: JP Chiba
- Agency: Brinks Gilson & Lione
- Priority: JP2008-218863 20080827
- Main IPC: G01N13/10
- IPC: G01N13/10

Abstract:
A displacement detection portion is provided in a lever portion of a cantilever or between the lever portion and a main body portion. The displacement detection portion is provided by laminating two conductor electrodes to sandwich an insulating portion. A thickness of the insulating portion (electrode interval) is set to a value capable of detecting a variation in tunnel current due to a change in electrode interval which corresponds to a displacement of the lever portion while a predetermined voltage is applied. When the lever portion is slightly displaced, the interval between the conductor electrodes changes. Therefore, the displacement may be detected as the variation in tunnel current at high resolution with sensitivity of an exponential multiple of the change in interval.
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