Invention Grant
US08719960B2 Temperature-dependent nanoscale contact potential measurement technique and device
有权
温度依赖性的纳米级接触电位测量技术和器件
- Patent Title: Temperature-dependent nanoscale contact potential measurement technique and device
- Patent Title (中): 温度依赖性的纳米级接触电位测量技术和器件
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Application No.: US12865490Application Date: 2009-01-30
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Publication No.: US08719960B2Publication Date: 2014-05-06
- Inventor: William P. King
- Applicant: William P. King
- Applicant Address: US IL Urbana
- Assignee: The Board of Trustees of the University of Illinois
- Current Assignee: The Board of Trustees of the University of Illinois
- Current Assignee Address: US IL Urbana
- Agency: Lathrop & Gage LLP
- International Application: PCT/US2009/032545 WO 20090130
- International Announcement: WO2009/097487 WO 20090806
- Main IPC: G01Q60/38
- IPC: G01Q60/38
Abstract:
The present invention provides a microcantilever capable of independently measuring and/or controlling the electrical potential and/or temperature of a surface with nanometer scale position resolution. The present invention also provides methods of manipulating, imaging, and/or mapping a surface or the properties of a surface with a microcantilever. The microcantilevers of the present invention are also capable of independently measuring and/or controlling the electrical potential and/or temperature of a gas or liquid. The devices and methods of the present invention are useful for applications including gas, liquid, and surface sensing, micro- and nano-fabrication, imaging and mapping of surface contours or surface properties.
Public/Granted literature
- US20110078834A1 Temperature-Dependent Nanoscale Contact Potential Measurement Technique and Device Public/Granted day:2011-03-31
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