Invention Grant
- Patent Title: Method of measuring printer spatial characteristics
- Patent Title (中): 测量打印机空间特性的方法
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Application No.: US12635788Application Date: 2009-12-11
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Publication No.: US08721025B2Publication Date: 2014-05-13
- Inventor: Ben Yip , Kieran Gerard Larkin , Peter Alleine Fletcher
- Applicant: Ben Yip , Kieran Gerard Larkin , Peter Alleine Fletcher
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Fitzpatrick, Cella, Harper & Scinto
- Priority: AU2008258213 20081218
- Main IPC: B41J29/393
- IPC: B41J29/393 ; G01B11/14

Abstract:
Methods, apparatuses, systems and computer program products for measuring spatial characteristics of an inkjet printer are disclosed. Group of marks of a first predetermined pattern are printed on a print medium using a first group of nozzles. Groups of marks of a second predetermined pattern are printed using a second group of nozzles. A region of overlap of the printed groups of marks is formed. At least a portion of the print medium having printed groups of marks is imaged. From the region of overlap, first and second groups of marks from the first and second printed patterns are selected. For each group of marks, a position representative of that group is determined. An offset for measuring spatial characteristics of the printer between the first and second printed patterns is determined dependent upon the representative position of each of the first and second groups of marks.
Public/Granted literature
- US20100156987A1 METHOD OF MEASURING PRINTER SPATIAL CHARACTERISTICS Public/Granted day:2010-06-24
Information query
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