Invention Grant
- Patent Title: Plasma cleaning apparatus and method
- Patent Title (中): 等离子体清洗装置及方法
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Application No.: US12582905Application Date: 2009-10-21
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Publication No.: US08721796B2Publication Date: 2014-05-13
- Inventor: Martin Deehan , Matt Cheng-Hsiung Tsai , Nan Lu , David T. Or , Mei Chang
- Applicant: Martin Deehan , Matt Cheng-Hsiung Tsai , Nan Lu , David T. Or , Mei Chang
- Applicant Address: US CA Santa Clara
- Assignee: Applied Materials, Inc.
- Current Assignee: Applied Materials, Inc.
- Current Assignee Address: US CA Santa Clara
- Agency: Patterson & Sheridan, LLP
- Main IPC: B08B6/00
- IPC: B08B6/00

Abstract:
Embodiments of the present invention generally include an apparatus for plasma cleaning and a method for plasma cleaning. The apparatus can include a lid body having a first surface for facing a pedestal during cleaning and a second surface opposite the first surface and substantially parallel to the first surface, the second surface having a first indentation sized to receive a magnet assembly, one or more handles coupled to the second surface of the lid body, and the magnet assembly resting in the first indentation. The method can include removing a sputtering target from the processing chamber, sealing the processing chamber, introducing a gas into the processing chamber, applying an RF bias to a pedestal within the processing chamber, maintaining the pedestal at a substantially constant temperature, and removing material from the pedestal to clean the pedestal.
Public/Granted literature
- US20100101602A1 PLASMA CLEANING APPARATUS AND METHOD Public/Granted day:2010-04-29
Information query
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