Invention Grant
US08722287B2 Phase shift focus monitor reticle, manufacturing method thereof and method for monitoring focus difference
有权
相移焦点监视器掩模版及其制造方法以及监控焦点差异的方法
- Patent Title: Phase shift focus monitor reticle, manufacturing method thereof and method for monitoring focus difference
- Patent Title (中): 相移焦点监视器掩模版及其制造方法以及监控焦点差异的方法
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Application No.: US13688407Application Date: 2012-11-29
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Publication No.: US08722287B2Publication Date: 2014-05-13
- Inventor: Wenliang Li , Peng Wu
- Applicant: Shanghai Huali Microelectronics Corporation
- Applicant Address: CN Shanghai
- Assignee: Shanghai Huali Microelectronics Corporation
- Current Assignee: Shanghai Huali Microelectronics Corporation
- Current Assignee Address: CN Shanghai
- Agency: Anova Law Group, PLLC
- Priority: CN201110392792 20111130
- Main IPC: G03F1/26
- IPC: G03F1/26 ; G03F1/44

Abstract:
The invention provides a phase shift focus monitor reticle, a manufacturing method thereof, and a method of monitoring focus difference using the phase shift focus monitor reticle. The phase shift focus monitor reticle comprises a shield comprising a plurality of light-transmitting portions with a certain width; and a glass layer positioned on the shield layer comprising a plurality of openings at the light-transmitting portions; wherein the width of the openings is half of the width of the light-transmitting portions; the depth of the openings is n*λ/(N−1), wherein λ is the wavelength of the lights incident on the phase shift focus monitor reticle in air, N is the refractive index of the glass layer, n is a positive integer. The invention can be applied to thicker photoresist and different process machines.
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