Invention Grant
US08722397B2 Method for detecting and quantifying endogenous wheat DNA sequence
失效
检测和定量内源性小麦DNA序列的方法
- Patent Title: Method for detecting and quantifying endogenous wheat DNA sequence
- Patent Title (中): 检测和定量内源性小麦DNA序列的方法
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Application No.: US13218385Application Date: 2011-08-25
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Publication No.: US08722397B2Publication Date: 2014-05-13
- Inventor: Akihiro Hino , Takashi Kodama , Mayu Iida , Hirohito Yamakawa , Satomi Nozaki , Katsuyuki Hayakawa
- Applicant: Akihiro Hino , Takashi Kodama , Mayu Iida , Hirohito Yamakawa , Satomi Nozaki , Katsuyuki Hayakawa
- Applicant Address: JP Tokyo JP Tsukuba-shi
- Assignee: Nisshin Seifun Group Inc.,Incorporated Administrative Agency National Agriculture and Food Research Organization
- Current Assignee: Nisshin Seifun Group Inc.,Incorporated Administrative Agency National Agriculture and Food Research Organization
- Current Assignee Address: JP Tokyo JP Tsukuba-shi
- Agency: Finnegan, Henderson, Farabow, Garrett & Dunner LLP.
- Priority: JP2004-115687 20040409
- Main IPC: C12N1/00
- IPC: C12N1/00 ; C12Q1/68 ; C12P19/34
Abstract:
A circular DNA is provided comprising endogenous DNA common to both genetically modified wheat and non-genetically modified wheat along with one or more pieces of DNA each having a sequence present specifically in a strain of genetically modified wheat. Also provided is a method for determining a mix rate of genetically modified wheat in a test sample.
Public/Granted literature
- US20120009585A1 METHOD FOR DETECTING AND QUNANTIFYING ENDOGENOUS WHEAT DNA SEQUENCE Public/Granted day:2012-01-12
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