Invention Grant
- Patent Title: Vertical guided layered probe
- Patent Title (中): 垂直引导分层探针
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Application No.: US12715896Application Date: 2010-03-02
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Publication No.: US08723546B2Publication Date: 2014-05-13
- Inventor: January Kister
- Applicant: January Kister
- Applicant Address: US CA Carlsbad
- Assignee: MicroProbe, Inc.
- Current Assignee: MicroProbe, Inc.
- Current Assignee Address: US CA Carlsbad
- Agency: Peacock Myers, P.C.
- Agent Deborah A. Peacock; Philip D. Askenazy
- Main IPC: G01R31/00
- IPC: G01R31/00 ; G01R31/20 ; G01R1/073 ; G01R1/067
Abstract:
The present invention is a set of layered probes that make electrical contact to a device under test. The layered probes are disposed within openings of at least one guide plate. The guide plate surrounds the probes via the openings. The layered probes have a base end, an opposing tip end and a shaft connecting the base end to the tip end. The base end can have a positioning device that extends away from the base end.
Public/Granted literature
- US20100176832A1 Vertical Guided Layered Probe Public/Granted day:2010-07-15
Information query
