Invention Grant
- Patent Title: On-the-fly device characterization from layouts of circuits
- Patent Title (中): 电路布局中的实时器件表征
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Application No.: US13115752Application Date: 2011-05-25
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Publication No.: US08726207B2Publication Date: 2014-05-13
- Inventor: Yu-Sian Jiang , Ya-Li Tai , Mu-Jen Huang , Chien-Wen Chen , Chauchin Su
- Applicant: Yu-Sian Jiang , Ya-Li Tai , Mu-Jen Huang , Chien-Wen Chen , Chauchin Su
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Slater & Matsil, L.L.P.
- Main IPC: G06F17/50
- IPC: G06F17/50

Abstract:
A design system includes a layout module and a user interface. The layout module includes a computing unit, which is configured to extract layout parameters of an integrated circuit device in a circuit during a layout stage of the circuit, and calculate circuit parameters of the device using the layout parameters. The user interface is configured to display the circuit parameters of the device in response to a user selection of the device.
Public/Granted literature
- US20120304146A1 On-the-Fly Device Characterization from Layouts of Circuits Public/Granted day:2012-11-29
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