Invention Grant
US08726727B2 Probe tips for airborne instruments used to measure cloud microphysical parameters
有权
用于测量云微物理参数的机载仪器的探头技巧
- Patent Title: Probe tips for airborne instruments used to measure cloud microphysical parameters
- Patent Title (中): 用于测量云微物理参数的机载仪器的探头技巧
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Application No.: US12983372Application Date: 2011-01-03
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Publication No.: US08726727B2Publication Date: 2014-05-20
- Inventor: Alexei Korolev
- Applicant: Alexei Korolev
- Applicant Address: CA
- Assignee: Her Majesty the Queen in right of Canada, as represented by the Minister of Environment
- Current Assignee: Her Majesty the Queen in right of Canada, as represented by the Minister of Environment
- Current Assignee Address: CA
- Agency: Schmeiser, Olsen & Watts, LLP
- Main IPC: G01W1/00
- IPC: G01W1/00
Abstract:
An instrument for obtaining airborne measurements of cloud microphysical parameters. The instrument comprises supporting arms mounted thereon, optics and a detector for measuring the cloud microphysical parameters The supporting arms define an optical path of the instrument and comprise probe tips affixed thereto. The probe tips comprise an outer portion and an inner portion opposite the outer portion. The inner portion of the tips may comprise an angled section having at least one angled surface shaped to deflect particles away from the optical path of the instrument.
Public/Granted literature
- US20110094298A1 PROBE TIPS FOR AIRBORNE INSTRUMENTS USED TO MEASURE CLOUD MICROPHYSICAL PARAMETERS Public/Granted day:2011-04-28
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