Invention Grant
- Patent Title: Laser processing apparatus,laser processing temperature measuring apparatus,laser processing method,and laser processing temperature measuring method
- Patent Title (中): 激光加工装置,激光加工温度测量装置,激光加工方法和激光加工温度测量方法
-
Application No.: US12591588Application Date: 2009-11-24
-
Publication No.: US08727610B2Publication Date: 2014-05-20
- Inventor: Satoshi Matsumoto , Tsuyoshi Kosugi
- Applicant: Satoshi Matsumoto , Tsuyoshi Kosugi
- Applicant Address: JP Hamamatsu-shi, Shizuoka
- Assignee: Hamamatsu Photonics K.K.
- Current Assignee: Hamamatsu Photonics K.K.
- Current Assignee Address: JP Hamamatsu-shi, Shizuoka
- Agency: Drinker Biddle & Reath LLP
- Priority: JPP2002-177652 20020618; JPP2002-177662 20020618
- Main IPC: G01J5/00
- IPC: G01J5/00 ; G01N25/00 ; G01K11/06 ; H05B11/00

Abstract:
The object is to provide a laser processing apparatus, a laser processing temperature measuring apparatus, a laser processing method, and a laser processing temperature measuring method which can highly accurately detect the processing temperature when carrying out processing such as welding with laser light. A laser processing apparatus 1A for processing members DR, UR to be processed by irradiating the members with laser light LB comprises a laser (semiconductor laser unit 20A) for generating the laser light LB; optical means for converging the laser light LB generated by the laser onto processing areas DA, UA; and a filter 30, disposed between the members DR, UR to be processed and the optical means, for blocking a wavelength of fluorescence generated by the optical means upon pumping with the laser light LB; wherein light having the wavelength blocked by the filter 30 is used for measuring a temperature of the processing areas DA, UA.
Public/Granted literature
Information query