Invention Grant
- Patent Title: Sample analyzer and sample transporting method
- Patent Title (中): 样品分析仪和样品输送方法
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Application No.: US13044100Application Date: 2011-03-09
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Publication No.: US08728396B2Publication Date: 2014-05-20
- Inventor: Keisuke Kuwano , Daigo Fukuma
- Applicant: Keisuke Kuwano , Daigo Fukuma
- Applicant Address: JP Kobe
- Assignee: Sysmex Corporation
- Current Assignee: Sysmex Corporation
- Current Assignee Address: JP Kobe
- Agency: Brinks Gilson & Lione
- Priority: JP2010-052836 20100310
- Main IPC: G01N21/00
- IPC: G01N21/00 ; G01N31/00 ; G01N33/00 ; G01N35/02 ; G01N35/00

Abstract:
The present invention is a sample analyzer including: a first and a second measurement unit configured to measure a sample accommodated in a sample container; a rack transport unit configured to transport each of a plurality of sample containers held in a sample rack to either the first or the second measurement unit; and a controller configured to acquire a measurement item information indicating a measurement item of each of samples accommodated in the plurality of sample containers held in the sample rack, determine a sample container to be a transport object and a measurement unit to be a transport destination of the sample container based on the acquired plurality of measurement item information, and control the rack transport unit to transport the sample container determined as the transport object to the measurement unit determined as the transport destination.
Public/Granted literature
- US20110223580A1 SAMPLE ANALYZER AND SAMPLE TRANSPORTING METHOD Public/Granted day:2011-09-15
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