Invention Grant
- Patent Title: System and method for indirectly measuring calcium ion efflux
- Patent Title (中): 间接测量钙离子流出的系统和方法
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Application No.: US12412966Application Date: 2009-03-27
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Publication No.: US08728439B2Publication Date: 2014-05-20
- Inventor: Tom Chih-Chuang Hu , Benjamin J. Waghorn
- Applicant: Tom Chih-Chuang Hu , Benjamin J. Waghorn
- Applicant Address: US GA Augusta
- Assignee: Celtrast LLC
- Current Assignee: Celtrast LLC
- Current Assignee Address: US GA Augusta
- Agency: Gardner, Groff, Greenwald & Villanueva, P.C.
- Main IPC: A61B5/055
- IPC: A61B5/055
Abstract:
A system and method for indirectly measuring calcium ion efflux from a cell of a subject by using manganese ions as a surrogate marker for calcium is disclosed. Manganese ion efflux is measured with a MEMRI T1-mapping method while the calcium-sodium exchanger is inhibited.
Public/Granted literature
- US20090246144A1 SYSTEM AND METHOD FOR INDIRECTLY MEASURING CALCIUM ION EFFLUX Public/Granted day:2009-10-01
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