Invention Grant
- Patent Title: Radiation detector
- Patent Title (中): 辐射检测器
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Application No.: US13760471Application Date: 2013-02-06
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Publication No.: US08729482B2Publication Date: 2014-05-20
- Inventor: Kenichi Watanabe , Yoshihiko Takahashi , Atsushi Yamazaki , Akira Uritani , Tetsuo Iguchi , Kentaro Fukuda , Noriaki Kawaguchi , Sumito Ishizu , Akira Yoshikawa , Takayuki Yanagida
- Applicant: Tokuyama Corporation , National University Corporation Nagoya University , Tohoku University
- Applicant Address: JP Shunan-shi, Yamaguchi JP Nagoya-shi, Aichi
- Assignee: Tokuyama Corporation,National University Corporation Nagoya University
- Current Assignee: Tokuyama Corporation,National University Corporation Nagoya University
- Current Assignee Address: JP Shunan-shi, Yamaguchi JP Nagoya-shi, Aichi
- Agency: Ladas & Parry LLP
- Priority: JP2012-038263 20120224
- Main IPC: G01T1/20
- IPC: G01T1/20 ; G01V5/10

Abstract:
Provided is a radiation detector with improved n/γ discrimination and usable even under high counting rate conditions with a reduced load on a signal-processing system. The detector capable of distinguishing neutron and gamma-ray events includes: a scintillator; an optical filter; a first photodetector to which a first part of light emitted from the scintillator is introduced via the optical filter; and a second photodetector to which a second part of light emitted from the scintillator is introduced not via the optical filter, wherein, for a set of two wavelengths A and (A+B) nm, the scintillator emits at least a light of A nm and a light of (A+B) nm when irradiated by gamma-ray, and emits a light of A nm and does not emit a light of (A+B) nm when irradiated by neutrons; and the optical filter blocks the light of A nm and transmits the light of (A+B) nm.
Public/Granted literature
- US20130221227A1 RADIATION DETECTOR Public/Granted day:2013-08-29
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