Invention Grant
- Patent Title: Low leakage capacitor for analog floating-gate integrated circuits
- Patent Title (中): 用于模拟浮栅集成电路的低漏电容
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Application No.: US13718485Application Date: 2012-12-18
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Publication No.: US08729616B2Publication Date: 2014-05-20
- Inventor: Imran Mahmood Khan , Allan T. Mitchell , Kaiping Liu
- Applicant: Texas Instruments Incorporated
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Current Assignee Address: US TX Dallas
- Agent Rose Alyssa Keagy; Wade J. Brady, III; Frederick J. Telecky, Jr.
- Main IPC: H01L29/94
- IPC: H01L29/94

Abstract:
An analog floating-gate electrode in an integrated circuit, and method of fabricating the same, in which trapped charge can be stored for long durations. The analog floating-gate electrode is formed in a polycrystalline silicon gate level, and includes portions serving as a transistor gate electrode, a plate of a metal-to-poly storage capacitor, and a plate of poly-to-active tunneling capacitors. Silicide-block silicon dioxide blocks the formation of silicide cladding on the electrode, while other polysilicon structures in the integrated circuit are silicide-clad.
Public/Granted literature
- US20130130450A1 LOW LEAKAGE CAPACITOR FOR ANALOG FLOATING-GATE INTEGRATED CIRCUITS Public/Granted day:2013-05-23
Information query
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