Invention Grant
- Patent Title: Interleaved ADC calibration
- Patent Title (中): 交错ADC校准
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Application No.: US13667977Application Date: 2012-11-02
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Publication No.: US08730072B2Publication Date: 2014-05-20
- Inventor: Roger Petigny , Hugo Gicquel , Fabien Reaute
- Applicant: STMicroelectronics (Grenoble 2) SAS
- Applicant Address: FR Grenoble
- Assignee: STMicroelectronics (Grenoble 2) SAS
- Current Assignee: STMicroelectronics (Grenoble 2) SAS
- Current Assignee Address: FR Grenoble
- Agency: Seed IP Law Group PLLC
- Priority: FR1159925 20111102
- Main IPC: H03M1/10
- IPC: H03M1/10 ; H03M1/12 ; H03M1/36
Abstract:
The present disclosure includes calibration circuitry for adjusting the bandwidth of at least one sub-converter of an interleaved analog to digital converter (ADC), the at least one sub-converter having an input switch coupled to an input line of the ADC, the calibration circuitry having a control circuit adapted to adjust a bulk voltage of a transistor forming the input switch.
Public/Granted literature
- US20130106631A1 INTERLEAVED ADC CALIBRATION Public/Granted day:2013-05-02
Information query
