Invention Grant
- Patent Title: Inspection apparatus and method for producing image for inspection
- Patent Title (中): 用于检查图像的检查装置和方法
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Application No.: US13160108Application Date: 2011-06-14
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Publication No.: US08730318B2Publication Date: 2014-05-20
- Inventor: Kenji Nakahira , Atsushi Miyamoto , Naoki Hosoya , Minoru Yoshida
- Applicant: Kenji Nakahira , Atsushi Miyamoto , Naoki Hosoya , Minoru Yoshida
- Applicant Address: JP Hitachi-shi
- Assignee: Hitachi-GE Nuclear Energy, Ltd.
- Current Assignee: Hitachi-GE Nuclear Energy, Ltd.
- Current Assignee Address: JP Hitachi-shi
- Agency: Crowell & Moring LLP
- Priority: JP2010-170561 20100729; JP2011-016614 20110128
- Main IPC: H04N9/47
- IPC: H04N9/47 ; H04N5/235 ; G06K9/00

Abstract:
In order to obtain a quality image without deterioration owing to radiation noise in inspection using the optical video camera in high radiation environment, an inspection apparatus is formed of an image pick-up unit, an image obtaining unit which fetches a video image that contains a signal (noise) that is substantially independent of each frame obtained by the image pick-up unit, a local alignment unit which locally aligns frames with different time phases for forming the image fetched by the image obtaining unit, a frame synthesizing unit which synthesizes the plurality of frames aligned by the local alignment unit for generating a synthesis frame with an SN ratio higher than the SN ratio of the frame before frame synthesis, and an image output unit for displaying or recording the image formed of the synthesis frame generated by the frame synthesizing unit.
Public/Granted literature
- US20120026317A1 Inspection Apparatus and Method for Producing Image for Inspection Public/Granted day:2012-02-02
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