Invention Grant
- Patent Title: Spectroscopic probe and method for detecting an inhomogeneity
- Patent Title (中): 光谱探针和检测不均匀性的方法
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Application No.: US12695718Application Date: 2010-01-28
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Publication No.: US08730467B2Publication Date: 2014-05-20
- Inventor: Fabien Chauchard , Sylvie Roussel
- Applicant: Fabien Chauchard , Sylvie Roussel
- Applicant Address: FR Prades le Lez
- Assignee: Indatech
- Current Assignee: Indatech
- Current Assignee Address: FR Prades le Lez
- Agency: Nath, Goldberg & Meyer
- Agent Jerald L. Meyer
- Priority: FR0953521 20090528; FR1050379 20100121
- Main IPC: G01N21/00
- IPC: G01N21/00

Abstract:
A method for detecting by spectroscopy an inhomogeneity (I) in a sample (E), includes that (i) the sample (E) is illuminated with incident light using means (23) for illuminating the sample (E), and (ii) the light re-emitted by the sample (E) is collected using means (24; 24′) for collecting the light, wherein (i) the light re-emitted by the sample (E) is collected at different spots arranged each spaced apart from the other spots and being located at the same distance from the means (23) for illuminating this sample (E) or their barycenter, and (ii) the presence of an inhomogeneity (I) in the sample (E) is determined based on the signals corresponding to the light re-emitted and collected at least at two different spots. A spectroscopic probe (2) and a device for analyzing a sample by spectroscopy implementing the method are also disclosed.
Public/Granted literature
- US20100302538A1 SPECTROSCOPIC PROBE AND METHOD FOR DETECTING AN INHOMOGENEITY Public/Granted day:2010-12-02
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