Invention Grant
- Patent Title: Variable breakdown transient voltage suppressor
- Patent Title (中): 可变击穿瞬态电压抑制器
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Application No.: US13334598Application Date: 2011-12-22
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Publication No.: US08730629B2Publication Date: 2014-05-20
- Inventor: Avinash Srikrishnan Kashyap , Stanislav Ivanovich Soloviev
- Applicant: Avinash Srikrishnan Kashyap , Stanislav Ivanovich Soloviev
- Applicant Address: US NY Niskayuna
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Niskayuna
- Agent Scott J. Asmus
- Main IPC: H02H3/22
- IPC: H02H3/22

Abstract:
A semiconductor die includes a substrate comprising a first layer of a first wide band gap semiconductor material having a first conductivity, a second layer of a second wide band gap semiconductor material having a second conductivity different from the first conductivity, in electrical contact with the first layer, a third layer of a third wide band gap semiconductor material having a third conductivity different from the first conductivity and second conductivity, in electrical contact with the second layer, a fourth layer of a fourth wide band gap semiconductor material having the second conductivity, in electrical contact with the third layer, and a fifth layer of a fifth wide band gap semiconductor material having the first conductivity and in electrical contact with the fourth layer, wherein the first layer, the second layer, the third layer, the fourth layer, and the fifth layer are sequentially arranged to form a structure.
Public/Granted literature
- US20130163139A1 VARIABLE BREAKDOWN TRANSIENT VOLTAGE SUPPRESSOR Public/Granted day:2013-06-27
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