Invention Grant
- Patent Title: Repair method and integrated circuit using the same
- Patent Title (中): 修理方法和集成电路采用相同的方法
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Application No.: US13336906Application Date: 2011-12-23
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Publication No.: US08730743B2Publication Date: 2014-05-20
- Inventor: Yong Deok Cho
- Applicant: Yong Deok Cho
- Applicant Address: KR Gyeonggi-do
- Assignee: SK Hynix Inc.
- Current Assignee: SK Hynix Inc.
- Current Assignee Address: KR Gyeonggi-do
- Agency: William Park & Associates Patent Ltd.
- Priority: KR10-2011-0033424 20110411
- Main IPC: G11C7/06
- IPC: G11C7/06
Abstract:
An integrated circuit includes: a memory controller configured to determine whether a memory cell included in a semiconductor memory device is defective or not and extract a fail address having positional information of the defective memory cell, in a test mode; and a fail address storage unit configured to store the fail address.
Public/Granted literature
- US20120257462A1 REPAIR METHOD AND INTEGRATED CIRCUIT USING THE SAME Public/Granted day:2012-10-11
Information query
