Invention Grant
- Patent Title: Nondestructive testing system
- Patent Title (中): 无损检测系统
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Application No.: US12948842Application Date: 2010-11-18
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Publication No.: US08732823B2Publication Date: 2014-05-20
- Inventor: Masayoshi Yokota , Sumito Nakano
- Applicant: Masayoshi Yokota , Sumito Nakano
- Applicant Address: JP Tokyo
- Assignee: Olympus Corporation
- Current Assignee: Olympus Corporation
- Current Assignee Address: JP Tokyo
- Agency: Holtz, Holtz, Goodman & Chick, PC
- Main IPC: G06F21/00
- IPC: G06F21/00

Abstract:
A nondestructive testing apparatus includes a display section and a storage section which stores predetermined executable functions. Each of the predetermined functions is initially set to one of a permitted state and a disabled state, and one of a display state and a non-display state on the display section. In an initial state, at least one of the predetermined functions is set to the disabled state and the non-display state. The nondestructive testing apparatus can receive permission information which unlocks at least one of the predetermined functions initially set to the disabled state so as to be set to the permitted state, and unlocks at least one of the predetermined functions initially set in the non-display state so as to be in the display state. The apparatus displays an operation icon only with respect to all of the predetermined functions set to the display state.
Public/Granted literature
- US20120131667A1 NONDESTRUCTIVE TESTING SYSTEM Public/Granted day:2012-05-24
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