Invention Grant
- Patent Title: Calibration of an on-die thermal sensor
- Patent Title (中): 校准片上热传感器
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Application No.: US13039037Application Date: 2011-03-02
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Publication No.: US08734006B2Publication Date: 2014-05-27
- Inventor: James M. Crafts , Joseph E. Dery , Timothy M. Skergan , Timothy C. Taylor
- Applicant: James M. Crafts , Joseph E. Dery , Timothy M. Skergan , Timothy C. Taylor
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Roberts Mlotkowski Safran & Cole, P.C.
- Agent David Cain
- Main IPC: G01K15/00
- IPC: G01K15/00 ; G01K7/00

Abstract:
A method of calibrating a thermal sensor includes setting a wafer to a control temperature. The wafer includes the thermal sensor and other chip logic. The method also includes applying power exclusively to a thermal sensor circuit, calibrating the thermal sensor, and storing a calibration result. The method also includes retrieving the calibration result upon application of power to the other chip logic.
Public/Granted literature
- US20120224602A1 CALIBRATION OF AN ON-DIE THERMAL SENSOR Public/Granted day:2012-09-06
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