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US08734006B2 Calibration of an on-die thermal sensor 有权
校准片上热传感器

Calibration of an on-die thermal sensor
Abstract:
A method of calibrating a thermal sensor includes setting a wafer to a control temperature. The wafer includes the thermal sensor and other chip logic. The method also includes applying power exclusively to a thermal sensor circuit, calibrating the thermal sensor, and storing a calibration result. The method also includes retrieving the calibration result upon application of power to the other chip logic.
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