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US08734586B2 Process for cleaning shield surfaces in deposition systems 有权
在沉积系统中清洁屏蔽表面的工艺

Process for cleaning shield surfaces in deposition systems
Abstract:
A process for cleaning and restoring deposition shield surfaces which results in a cleaned shield having a surface roughness of between about 200 microinches and about 500 microinches and a particle surface density of less than about 0.1 particles/mm2 of particles between about 1 micron and about 5 microns in size and no particles less than about 1 micron in size and method for use thereof is disclosed.
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