Invention Grant
- Patent Title: Film deposition method and apparatus
- Patent Title (中): 薄膜沉积方法和装置
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Application No.: US13401919Application Date: 2012-02-22
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Publication No.: US08734901B2Publication Date: 2014-05-27
- Inventor: Keisuke Suzuki , Pao-Hwa Chou , Te ching Chang
- Applicant: Keisuke Suzuki , Pao-Hwa Chou , Te ching Chang
- Applicant Address: JP Tokyo
- Assignee: Tokyo Electron Limited
- Current Assignee: Tokyo Electron Limited
- Current Assignee Address: JP Tokyo
- Agency: IPUSA, PLLC
- Priority: JP2011-038509 20110224
- Main IPC: C23C16/00
- IPC: C23C16/00

Abstract:
A film deposition method of depositing a thin film by alternately supplying at least a first source gas and a second source gas to a substrate is disclosed. The film deposition method includes steps of evacuating a process chamber where the substrate is accommodated, without supplying any gas to the process chamber; supplying an inert gas to the process chamber until a pressure within the process chamber becomes a predetermined pressure; supplying the first source gas to the process chamber filled with the inert gas at the predetermined pressure without evacuating the process chamber; stopping supplying the first source gas to the process chamber and evacuating the process chamber; supplying the second source gas to the process chamber; and stopping supplying the second source gas to the process chamber and evacuating the process chamber.
Public/Granted literature
- US20120269969A1 FILM DEPOSITION METHOD AND APPARATUS Public/Granted day:2012-10-25
Information query
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