Invention Grant
US08735244B2 Semiconductor device devoid of an interfacial layer and methods of manufacture 有权
没有界面层的半导体器件和制造方法

Semiconductor device devoid of an interfacial layer and methods of manufacture
Abstract:
A method of forming a dielectric stack devoid of an interfacial layer includes subjecting an exposed interfacial layer provided on a semiconductor material to a low pressure thermal anneal process for a predetermined time period at a temperature of about 900° C. to about 1000° C. with an inert gas purge. A semiconductor structure is also disclosed, with a dielectric stack devoid of an interfacial layer.
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