Invention Grant
- Patent Title: Semiconductor device having a through contact and a manufacturing method therefor
- Patent Title (中): 具有通孔的半导体器件及其制造方法
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Application No.: US13279846Application Date: 2011-10-24
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Publication No.: US08735262B2Publication Date: 2014-05-27
- Inventor: Hermann Gruber , Thomas Gross , Andreas Peter Meiser , Markus Zundel
- Applicant: Hermann Gruber , Thomas Gross , Andreas Peter Meiser , Markus Zundel
- Applicant Address: DE Neubiberg
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE Neubiberg
- Agency: Murphy, Bilak & Homiller, PLLC
- Main IPC: H01L21/301
- IPC: H01L21/301 ; H01L21/00

Abstract:
According to an embodiment, a method of forming a semiconductor device includes: providing a wafer having a semiconductor substrate with a first side a second side opposite the first side, and a dielectric region arranged on the first side; mounting the wafer with the first side on a carrier system; etching a deep vertical trench from the second side through the semiconductor substrate to the dielectric region, thereby insulating a mesa region from the remaining semiconductor substrate; and filling the deep vertical trench with a dielectric material.
Public/Granted literature
- US20130099308A1 Semiconductor Device Having a Through Contact and a Manufacturing Method Therefor Public/Granted day:2013-04-25
Information query
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