Invention Grant
- Patent Title: Chromatograph mass spectrometer
- Patent Title (中): 色谱质谱仪
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Application No.: US13890558Application Date: 2013-05-09
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Publication No.: US08735809B2Publication Date: 2014-05-27
- Inventor: Takashi Sumiyoshi
- Applicant: Shimadzu Corporation
- Applicant Address: JP Kyoto
- Assignee: Shimadzu Corporation
- Current Assignee: Shimadzu Corporation
- Current Assignee Address: JP Kyoto
- Agency: Sughrue Mion, PLLC
- Priority: JP2010-285555 20101222
- Main IPC: B01D59/44
- IPC: B01D59/44

Abstract:
After an analysis condition table for measuring each compound is automatically generated in accordance with a compound table, the loop time is calculated for each measurement section for which the overlapping of measurement events differs. If the loop time exceeds a specified value in a given measurement section of a given compound, the event with the earliest end time and the event with the latest start time are extracted from among the overlapping measurement events, and the intermediate time between the end time and the start time is found to adjust the length of each measurement event. By repeating this process, a parameter in the analysis condition table is corrected so that the loop time becomes equal to or less than the specified value.
Public/Granted literature
- US20130240727A1 CHROMATOGRAPH MASS SPECTROMETER Public/Granted day:2013-09-19
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