Invention Grant
- Patent Title: Non-volatile memory device formed by dual floating gate deposit
- Patent Title (中): 通过双浮栅沉积形成的非易失性存储器件
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Application No.: US14079981Application Date: 2013-11-14
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Publication No.: US08735959B2Publication Date: 2014-05-27
- Inventor: Erwan Dornel
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Cantor Colburn LLP
- Agent Ian MacKinnon
- Main IPC: H01L29/76
- IPC: H01L29/76 ; H01L29/788

Abstract:
A device includes a substrate; a shallow trench isolation (STI) region located in the substrate, the STI region comprising an STI material, and further comprising a recess in the STI material, the recess having a bottom and sides; a floating gate, wherein a portion of the floating gate is located on a side of the recess in the STI region and is separated from the substrate by a portion of the STI material; and a gate dielectric layer located over the floating gate, and a control gate located over the gate dielectric layer, wherein a portion of the control gate is located in the recess.
Public/Granted literature
- US20140061760A1 NON-VOLATILE MEMORY DEVICE FORMED BY DUAL FLOATING GATE DEPOSIT Public/Granted day:2014-03-06
Information query
IPC分类: