Invention Grant
US08736042B2 Delamination resistant device package having raised bond surface and mold locking aperture
有权
具有升高的粘合表面和模具锁定孔的防分离装置包装
- Patent Title: Delamination resistant device package having raised bond surface and mold locking aperture
- Patent Title (中): 具有升高的粘合表面和模具锁定孔的防分离装置包装
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Application No.: US13324749Application Date: 2011-12-13
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Publication No.: US08736042B2Publication Date: 2014-05-27
- Inventor: Felix C. Li , Yee Kim Lee , Peng Soon Lim , Terh Kuen Yii , Lee Han Meng@Eugene Lee
- Applicant: Felix C. Li , Yee Kim Lee , Peng Soon Lim , Terh Kuen Yii , Lee Han Meng@Eugene Lee
- Applicant Address: US CA Santa Clara
- Assignee: National Semiconductor Corporation
- Current Assignee: National Semiconductor Corporation
- Current Assignee Address: US CA Santa Clara
- Agent Eugene C. Conser; Wade J. Brady, III; Frederick J. Telecky, Jr.
- Main IPC: H01L23/48
- IPC: H01L23/48 ; H01L23/52 ; H01L23/495

Abstract:
A semiconductor package configured to attain a thin profile and low moisture sensitivity. Packages of this invention can include a semiconductor die mounted on a die attachment site of a leadframe and further connected with a plurality of elongate I/O leads arranged about the die attach pad and extending in said first direction. The leadframe having an “up-set” bonding pad arranged with a bonding support for supporting a plurality of wire bonds and a large mold flow aperture in the up-set bonding pad. The package encapsulated in a mold material that surrounds the bonding support and flows through the large mold flow aperture to establish well supported wire bonds such that the package has low moisture sensitivity.
Public/Granted literature
- US20120080781A1 DELAMINATION RESISTANT DEVICE PACKAGE HAVING RAISED BOND SURFACE AND MOLD LOCKING APERTURE Public/Granted day:2012-04-05
Information query
IPC分类: