Invention Grant
US08736323B2 Method and apparatus for on-chip phase error measurement to determine jitter in phase-locked loops
有权
用于片内相位误差测量的方法和装置,用于确定锁相环中的抖动
- Patent Title: Method and apparatus for on-chip phase error measurement to determine jitter in phase-locked loops
- Patent Title (中): 用于片内相位误差测量的方法和装置,用于确定锁相环中的抖动
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Application No.: US11622166Application Date: 2007-01-11
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Publication No.: US08736323B2Publication Date: 2014-05-27
- Inventor: Woogeun Rhee , Daniel J. Friedman
- Applicant: Woogeun Rhee , Daniel J. Friedman
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Tutunjian & Bitetto, P.C.
- Agent Anne V. Dougherty
- Main IPC: H03L7/06
- IPC: H03L7/06

Abstract:
An apparatus includes a phase-locked loop (PLL) circuit including a phase-frequency detector configured to output phase error signals. A phase error monitor circuit is configured to determine instantaneous peak phase error by logically combining the phase error signals and comparing pulse widths of the logically combined phase error signals to a programmable delay time at each reference clock cycle to determine instantaneous phase error change. A storage element is configured to store the instantaneous phase error change.
Public/Granted literature
- US20080172193A1 METHOD AND APPARATUS FOR ON-CHIP PHASE ERROR MEASUREMENT TO DETERMINE JITTER IN PHASE-LOCKED LOOPS Public/Granted day:2008-07-17
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