Invention Grant
- Patent Title: High precision single edge capture and delay measurement circuit
- Patent Title (中): 高精度单边沿捕获和延迟测量电路
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Application No.: US13444195Application Date: 2012-04-11
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Publication No.: US08736338B2Publication Date: 2014-05-27
- Inventor: Lipeng Cao , Carol G. Pyron , Kenneth R. Burch , Ramon V. Enriquez
- Applicant: Lipeng Cao , Carol G. Pyron , Kenneth R. Burch , Ramon V. Enriquez
- Applicant Address: US TX Austin
- Assignee: Freescale Semiconductor, Inc.
- Current Assignee: Freescale Semiconductor, Inc.
- Current Assignee Address: US TX Austin
- Agency: Terrile, Cannatti, Chambers & Holland, LLP
- Agent Michael Rocco Cannatti
- Main IPC: H03K3/00
- IPC: H03K3/00 ; G06F1/04
Abstract:
A method and circuit for providing on-chip measurement of the delay between two signals includes first and second delay chains (241, 242) having different delay values connected to sampling latches (222-227) which each include a data input coupled between adjacent delay elements of the first delay chain and a clock input coupled between adjacent delay elements of the second delay chain, thereby capturing a high precision delay measurement for the signals.
Public/Granted literature
- US20130271196A1 High Precision Single Edge Capture and Delay Measurement Circuit Public/Granted day:2013-10-17
Information query
