Invention Grant
US08736850B2 Method and device for measuring surfaces in a highly precise manner
有权
用于以高度精确的方式测量表面的方法和装置
- Patent Title: Method and device for measuring surfaces in a highly precise manner
- Patent Title (中): 用于以高度精确的方式测量表面的方法和装置
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Application No.: US13982455Application Date: 2012-02-08
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Publication No.: US08736850B2Publication Date: 2014-05-27
- Inventor: Christian Am Weg , Gernot Berger , Thilo May , Ralf Nicolaus , Jurgen Petter
- Applicant: Christian Am Weg , Gernot Berger , Thilo May , Ralf Nicolaus , Jurgen Petter
- Applicant Address: DE Mainz
- Assignee: LUPHOS GmbH
- Current Assignee: LUPHOS GmbH
- Current Assignee Address: DE Mainz
- Agency: Christopher C. Dremann, P.C.
- Agent Christopher C. Dremann
- Priority: DE102011011065 20110211
- International Application: PCT/EP2012/000575 WO 20120208
- International Announcement: WO2012/107225 WO 20120816
- Main IPC: G01B11/24
- IPC: G01B11/24 ; G01B11/02 ; G01B21/20

Abstract:
A device and a method for measuring at least one surface section of an object that is mounted on a carrier includes at least one reference object that can be fixed relative to the carrier, and a holder that can be moved relative to the reference object in at least one first direction and on which a reference body and a distance measuring device are arranged. The reference body and the distance measuring device are mounted in a rotatable manner relative to each other. The distance measuring device is designed to determine a first distance to a first point of the surface section of the object and a second distance to a second point of the reference body wherein the second point corresponds to the first point.
Public/Granted literature
- US20130308139A1 METHOD AND DEVICE FOR MEASURING SURFACES IN A HIGHLY PRECISE MANNER Public/Granted day:2013-11-21
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