Invention Grant
US08737141B2 Apparatus and method for determining an operating condition of a memory cell based on cycle information 有权
基于周期信息确定存储器单元的工作状态的装置和方法

  • Patent Title: Apparatus and method for determining an operating condition of a memory cell based on cycle information
  • Patent Title (中): 基于周期信息确定存储器单元的工作状态的装置和方法
  • Application No.: US13177518
    Application Date: 2011-07-06
  • Publication No.: US08737141B2
    Publication Date: 2014-05-27
  • Inventor: Ashot Melik-Martirosian
  • Applicant: Ashot Melik-Martirosian
  • Applicant Address: US CA Santa Ana
  • Assignee: STEC, Inc.
  • Current Assignee: STEC, Inc.
  • Current Assignee Address: US CA Santa Ana
  • Agency: McDermott Will & Emery LLP
  • Main IPC: G11C7/00
  • IPC: G11C7/00
Apparatus and method for determining an operating condition of a memory cell based on cycle information
Abstract:
Disclosed is an apparatus and method for determining a parameter for programming a non-volatile memory circuit. On receiving write or erase operation a parameter is determined as a function of a circuit characteristic associated with a memory block. An adjusted condition, for example, read or write time, or the standard deviation of voltage thresholds in a distribution of cells, is then determined as a function of the parameter, and a command provided to the memory circuit to use the parameter in the next write or erase operation performed on the memory block. The method can be triggered by an event such as P/E cycle times and the condition is dynamically adjusted to extend the life of the memory circuit.
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