Invention Grant
- Patent Title: Delay lock loop phase glitch error filter
- Patent Title (中): 延时锁相相位毛刺误差滤波器
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Application No.: US13271048Application Date: 2011-10-11
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Publication No.: US08737556B2Publication Date: 2014-05-27
- Inventor: Long B. Guan
- Applicant: Long B. Guan
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Dorsey & Whitney LLP
- Priority: SG200404850-0 20040830
- Main IPC: H03D3/24
- IPC: H03D3/24

Abstract:
A method and apparatus is provided for providing a phase glitch error filter for a delay lock loop. The device comprises a delay lock loop to provide an output signal based upon a phase difference between a reference signal and a feedback signal. The delay lock loop comprises a filter unit to provide filtering of noise on a phase control signal to substantially reduce a false delay lock loop state.
Public/Granted literature
- US20120019293A1 DELAY LOCK LOOP PHASE GLITCH ERROR FILTER Public/Granted day:2012-01-26
Information query
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