Invention Grant
- Patent Title: Alignment unit control apparatus and alignment method
- Patent Title (中): 对齐单元控制装置及对准方法
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Application No.: US13056566Application Date: 2009-10-28
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Publication No.: US08737719B2Publication Date: 2014-05-27
- Inventor: Yoichiro Tsumura , Takanori Inaba
- Applicant: Yoichiro Tsumura , Takanori Inaba
- Applicant Address: JP Tokyo JP Kanagawa
- Assignee: Mitsubishi Heavy Industries, Ltd.,Fast Corporation
- Current Assignee: Mitsubishi Heavy Industries, Ltd.,Fast Corporation
- Current Assignee Address: JP Tokyo JP Kanagawa
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Priority: JP2008-279262 20081030
- International Application: PCT/JP2009/068486 WO 20091028
- International Announcement: WO2010/050500 WO 20100506
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
An alignment unit control apparatus according to the present invention includes: an imaging section configured to control cameras to image a plurality of regions on a surface of a substrate to generate a plurality of images; a region detecting section configured to select a detection region from the plurality of regions based on the plurality of images; and an aligning section configured to align the substrate based on an alignment image obtained by imaging a mark of the substrate in the detection region by one of the plurality of cameras. For this reason, the alignment unit control apparatus does not need to have another mechanism for the purpose of positioning the mark for alignment in the field of vision of the camera, and can more easily be manufactured, and a region of an alignment mark can be detected more easily.
Public/Granted literature
- US20110134235A1 ALIGNMENT UNIT CONTROL APPARATUS AND ALIGNMENT METHOD Public/Granted day:2011-06-09
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