Invention Grant
- Patent Title: Substrate media height measurement system and method
- Patent Title (中): 基板介质高度测量系统及方法
-
Application No.: US13630871Application Date: 2012-09-28
-
Publication No.: US08737906B2Publication Date: 2014-05-27
- Inventor: Joannes N. M. de Jong , Thomas Wyble
- Applicant: Joannes N. M. de Jong , Thomas Wyble
- Applicant Address: US CT Norwalk
- Assignee: Xerox Corporation
- Current Assignee: Xerox Corporation
- Current Assignee Address: US CT Norwalk
- Main IPC: G03G15/00
- IPC: G03G15/00 ; B41J2/01 ; B41J29/38

Abstract:
A system and method for determining substrate media height including a media transport having a transport surface for carrying thereon substrate media along a media path in a process direction past a print zone. A media height detector is disposed upstream of the print zone. The height detector includes an elongate member disposed above the transport surface and extending across the transport surface in a cross-process direction. The elongate member is slanted with respect to the transport surface with a distance between the elongate member and the transport surface decreasing as the detector extends in the process direction. The height detector includes a deflection sensor operably connected to the elongate member. The deflection sensor senses deflection of the elongate member.
Public/Granted literature
- US20140092159A1 SUBSTRATE MEDIA HEIGHT MEASUREMENT SYSTEM AND METHOD Public/Granted day:2014-04-03
Information query