Invention Grant
- Patent Title: System and method for ultrasonic testing
- Patent Title (中): 超声波检测系统及方法
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Application No.: US12588114Application Date: 2009-10-05
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Publication No.: US08738339B2Publication Date: 2014-05-27
- Inventor: Daniel Richard , Dirk Verspeelt , Frederic Morrow , Guy Maes , Jean-Francois Tremblay , Martin Garneau , Stephane Turgeon , Alexandre Charlebois
- Applicant: Daniel Richard , Dirk Verspeelt , Frederic Morrow , Guy Maes , Jean-Francois Tremblay , Martin Garneau , Stephane Turgeon , Alexandre Charlebois
- Applicant Address: US WA Snoqualmie
- Assignee: Zetec, Inc.
- Current Assignee: Zetec, Inc.
- Current Assignee Address: US WA Snoqualmie
- Agency: Caesar, Rivise, Bernstein, Cohen & Pokotilow, Ltd.
- Priority: CA2640462 20081003
- Main IPC: G06F7/60
- IPC: G06F7/60 ; G06G7/48 ; G01B5/28 ; G01H1/08 ; G01N9/24 ; G01N29/00

Abstract:
A method of establishing position dependent focal laws and dynamically accessing these focal laws during inspection is disclosed comprising the steps of partitioning a CAD model into distinct geometric regions prior to inspection, generating a dedicated set of focal laws for each of the geometric regions, and associating each position of the scanner with one of the geometric regions. A method of compressing an A-Scan using a windowing technique is also disclosed. Additionally, methods for computing and displaying volumetric slices in real-time are disclosed. Finally, a method of firing multiple probes at different firing frequencies is disclosed, as well as a multi-probe inspection system that enables parallel firing.
Public/Granted literature
- US20100094606A1 System and method for ultrasonic testing Public/Granted day:2010-04-15
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