Invention Grant
US08738969B2 Semiconductor device and method for tracing a memory of a semiconductor device
有权
用于跟踪半导体器件的存储器的半导体器件和方法
- Patent Title: Semiconductor device and method for tracing a memory of a semiconductor device
- Patent Title (中): 用于跟踪半导体器件的存储器的半导体器件和方法
-
Application No.: US13366965Application Date: 2012-02-06
-
Publication No.: US08738969B2Publication Date: 2014-05-27
- Inventor: Rainer Troppmann , Frank Noha
- Applicant: Rainer Troppmann , Frank Noha
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Current Assignee Address: US TX Dallas
- Agent John R. Pessetto; Wade J. Brady, III; Frederick J. Telecky, Jr.
- Priority: DE102011107936 20110719
- Main IPC: G06F11/00
- IPC: G06F11/00

Abstract:
An embodiment of the invention provides a memory on a semiconductor device that has a plurality of memory areas where each memory area has a plurality of consecutive bits. Further, the semiconductor device includes a tag memory having a plurality of trace tags, each trace tag including at least one bit. Each memory area of the memory is mapped to a trace tag that indicates whether the respective memory area is selected for tracing or not. Each memory area and the assigned trace tag are read out and address of the memory area is forwarded to a trace module when an assigned trace tag indicates that the memory area is selected for tracing. When the assigned trace tag indicates that the memory area is not selected for tracing, data and address is discarded.
Public/Granted literature
- US20130024733A1 Semiconductor Device and Method for Tracing a Memory of a Semiconductor Device Public/Granted day:2013-01-24
Information query