Invention Grant
US08739398B2 Method and apparatus for detethering mesoscale, microscale, and nanoscale components and devices
有权
用于去除中尺度,微尺度和纳米尺度部件和装置的方法和装置
- Patent Title: Method and apparatus for detethering mesoscale, microscale, and nanoscale components and devices
- Patent Title (中): 用于去除中尺度,微尺度和纳米尺度部件和装置的方法和装置
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Application No.: US12744049Application Date: 2008-11-20
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Publication No.: US08739398B2Publication Date: 2014-06-03
- Inventor: Mohammad A. Mayyas , Panayoitis S. Shiakolas
- Applicant: Mohammad A. Mayyas , Panayoitis S. Shiakolas
- Applicant Address: US TX Austin
- Assignee: Board of Regents, The University of Texas System
- Current Assignee: Board of Regents, The University of Texas System
- Current Assignee Address: US TX Austin
- Agency: Chowdhury & Georgakis, P.C.
- International Application: PCT/US2008/084251 WO 20081120
- International Announcement: WO2009/067635 WO 20090528
- Main IPC: H05K3/30
- IPC: H05K3/30 ; H05K3/34

Abstract:
A method for forming an electronic device includes designing a tether having first and second ends; selecting an attachment point on the electronic device; attaching the first end of the tether to the attachment point, the electronic device being encapsulated in a cell; selecting an anchor point; attaching the second end of the tether to the anchor point; determining fracture condition at which the first end of the tether detaches from the attachment point; agitating the cell at the fracture conditions so as to detach the first end of the tether from the attachment point; and separating the electronic device from the cell. Also provided is a method for designing a plurality of electronic devices, wherein each of the electronic devices is encapsulated in a cell of a wafer, die or other holder and wherein the fracture conditions are the same for a group of the electronic devices.
Public/Granted literature
- US20100306993A1 Method and Apparatus for Detethering Mesoscale, Microscale, and Nanoscale Components and Devices Public/Granted day:2010-12-09
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