Invention Grant
- Patent Title: Apparatus for and method of reading targets arbitrarily oriented in imaging workstations
- Patent Title (中): 在成像工作站中任意取向读取目标的装置和方法
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Application No.: US13267323Application Date: 2011-10-06
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Publication No.: US08740075B2Publication Date: 2014-06-03
- Inventor: Mark Drzymala , Edward Barkan
- Applicant: Mark Drzymala , Edward Barkan
- Applicant Address: US NY Holtsville
- Assignee: Symbol Technologies, Inc.
- Current Assignee: Symbol Technologies, Inc.
- Current Assignee Address: US NY Holtsville
- Agent Nong-Qiang Fan
- Main IPC: G06K7/10
- IPC: G06K7/10

Abstract:
An apparatus for and method of electro-optically reading targets arbitrarily oriented in a workstation, such as a dual window workstation, employs a solid-state imager for capturing return light from the targets over a field of view. The imager has an array of sensors arranged along mutually perpendicular array axes. An optical system splits the field of view into a plurality of subfields of view that extend through a workstation window to a target. One subfield is optically configured to enable the imager to capture light from the target along one array axis. Another subfield is optically configured to enable the imager to capture light from the target along the other array axis. A controller processes the captured light in both the one and the other subfields to enable the reading of the arbitrarily oriented target in the workstation independently of target orientation relative to the array axes.
Public/Granted literature
- US20130087617A1 APPARATUS FOR AND METHOD OF READING TARGETS ARBITRARILY ORIENTED IN IMAGING WORKSTATIONS Public/Granted day:2013-04-11
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