Invention Grant
- Patent Title: Wet etching method for silicon nitride film
- Patent Title (中): 氮化硅膜湿法蚀刻法
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Application No.: US13424904Application Date: 2012-03-20
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Publication No.: US08741168B2Publication Date: 2014-06-03
- Inventor: Yasuhito Yoshimizu , Hisashi Okuchi , Hiroshi Tomita
- Applicant: Yasuhito Yoshimizu , Hisashi Okuchi , Hiroshi Tomita
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Finnegan, Henderson, Farabow, Garrett & Dunner, L.L.P.
- Priority: JP2011-197977 20110912
- Main IPC: C03C15/00
- IPC: C03C15/00

Abstract:
According to one embodiment, an etching method includes: supplying an etching-resistant material; and etching the silicon nitride film. The supplying includes supplying the etching-resistant material to a processing surface including a surface of a silicon nitride film and a surface of a non-etching film, the non-etching film including a material different from the silicon nitride film. The etching includes etching the silicon nitride film using an etchant in a state of the etching-resistant material being formed relatively more densely on the surface of the non-etching film than on the surface of the silicon nitride film.
Public/Granted literature
- US20130065400A1 ETCHING METHOD Public/Granted day:2013-03-14
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