Invention Grant
- Patent Title: Sample processing system, base for sample processing system, and sample processing apparatus
- Patent Title (中): 样品处理系统,样品处理系统基座和样品处理设备
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Application No.: US12638695Application Date: 2009-12-15
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Publication No.: US08741219B2Publication Date: 2014-06-03
- Inventor: Yuichi Hamada , Keisuke Kuwano
- Applicant: Yuichi Hamada , Keisuke Kuwano
- Applicant Address: JP Kobe
- Assignee: Sysmex Corporation
- Current Assignee: Sysmex Corporation
- Current Assignee Address: JP Kobe
- Agency: Brinks Gilson & Lione
- Priority: JP2008-319560 20081216
- Main IPC: G01N21/00
- IPC: G01N21/00 ; G01N31/00 ; G01N33/00 ; G01N35/02 ; G01N21/75 ; G01N31/22 ; G01N33/52 ; G01N35/00

Abstract:
A sample processing system comprising: a transporting apparatus for transporting a sample; a plurality of sample processing apparatuses, arranged along a direction in which the sample is transported by the transporting apparatus, for processing the sample transported by the transporting apparatus; a base on which at least one of the sample processing apparatuses is placed; and a movement restricting section for restricting, on the base, a movement area within which the sample processing apparatus moves, wherein the movement restricting section allows the sample processing apparatus to move on the base so as to change orientation of the sample processing apparatus, is disclosed. A base for a sample processing system and a sample processing apparatus are also disclosed.
Public/Granted literature
- US20100150780A1 SAMPLE PROCESSING SYSTEM, BASE FOR SAMPLE PROCESSING SYSTEM, AND SAMPLE PROCESSING APPARATUS Public/Granted day:2010-06-17
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