Invention Grant
US08741729B2 Dual contact trench resistor and capacitor in shallow trench isolation (STI) and methods of manufacture
有权
双接触沟槽电阻和电容器在浅沟槽隔离(STI)和制造方法
- Patent Title: Dual contact trench resistor and capacitor in shallow trench isolation (STI) and methods of manufacture
- Patent Title (中): 双接触沟槽电阻和电容器在浅沟槽隔离(STI)和制造方法
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Application No.: US13939694Application Date: 2013-07-11
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Publication No.: US08741729B2Publication Date: 2014-06-03
- Inventor: Timothy W. Kemerer , James S. Nakos , Steven M. Shank
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Roberts Mlotkowski Safran & Cole, P.C.
- Agent Richard Kotulak
- Main IPC: H01L21/20
- IPC: H01L21/20

Abstract:
A resistor and capacitor are provided in respective shallow trench isolation structures. The method includes forming a first and second trench in a substrate and forming a first insulator layer within the first and second trench. The method includes forming a first electrode material within the first and second trench, on the first insulator layer, and forming a second insulator layer within the first and second trench and on the first electrode material. The method includes forming a second electrode material within the first and second trench, on the second insulator layer. The second electrode material pinches off the second trench. The method includes removing a portion of the second electrode material and the second insulator layer at a bottom portion of the first trench, and filling in the first trench with additional second electrode material. The additional second electrode material is in electrical contact with the first electrode material.
Public/Granted literature
- US20130292798A1 DUAL CONTACT TRENCH RESISTOR AND CAPACITOR IN SHALLOW TRENCH ISOLATION (STI) AND METHODS OF MANUFACTURE Public/Granted day:2013-11-07
Information query
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