Invention Grant
- Patent Title: Method for manufacturing SOI substrate
- Patent Title (中): 制造SOI衬底的方法
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Application No.: US12568772Application Date: 2009-09-29
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Publication No.: US08741740B2Publication Date: 2014-06-03
- Inventor: Akihisa Shimomura , Hajime Tokunaga
- Applicant: Akihisa Shimomura , Hajime Tokunaga
- Applicant Address: JP Atsugi-shi, Kanagawa-ken
- Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee Address: JP Atsugi-shi, Kanagawa-ken
- Agency: Robinson Intellectual Property Law Office, P.C.
- Agent Eric J. Robinson
- Priority: JP2008-257032 20081002
- Main IPC: H01L21/30
- IPC: H01L21/30

Abstract:
An SOI substrate is manufactured by forming an embrittled layer in a bond substrate by increasing the dose of hydrogen ions in the formation of the embrittled layer to a value more than the dose of hydrogen ions of the lower limit for separation of the bond substrate, separating the bond substrate attached to the base substrate, forming an SOI substrate in which a single crystal semiconductor film is formed over the base substrate, and irradiating a surface of the single crystal semiconductor film with laser light.
Public/Granted literature
- US20100087045A1 METHOD FOR MANUFACTURING SOI SUBSTRATE Public/Granted day:2010-04-08
Information query
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