Invention Grant
- Patent Title: Bonding wire for semiconductor
- Patent Title (中): 半导体用导线
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Application No.: US13384819Application Date: 2010-07-16
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Publication No.: US08742258B2Publication Date: 2014-06-03
- Inventor: Shinichi Terashima , Tomohiro Uno , Takashi Yamada , Daizo Oda
- Applicant: Shinichi Terashima , Tomohiro Uno , Takashi Yamada , Daizo Oda
- Applicant Address: JP Tokyo JP Saitama
- Assignee: Nippon Steel & Sumikin Materials Co., Ltd.,Nippon Micrometal Corporation
- Current Assignee: Nippon Steel & Sumikin Materials Co., Ltd.,Nippon Micrometal Corporation
- Current Assignee Address: JP Tokyo JP Saitama
- Agency: McDermott Will & Emery LLP
- Priority: JP2009-177315 20090730; JP2009-226464 20090930
- International Application: PCT/JP2010/062082 WO 20100716
- International Announcement: WO2011/013527 WO 20110203
- Main IPC: H01B5/00
- IPC: H01B5/00

Abstract:
A bonding wire for semiconductor includes: a core wire of copper or a copper alloy; a coating layer containing palladium and having a thickness of 10 to 200 nm; and an alloy layer formed on a surface of the coating layer. The alloy layer contains a noble metal and palladium and having a thickness of 1 to 80 nm. The noble metal is either gold or silver, and a concentration of the noble metal in the alloy layer is not less than 10% and not more than 75% by volume.
Public/Granted literature
- US20130306352A2 BONDING WIRE FOR SEMICONDUCTOR Public/Granted day:2013-11-21
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