A solid-state imaging device includes: a pixel array unit that includes a plurality of pixels arranged two dimensionally and a plurality of read-out signal lines used for reading out pixel signals from the plurality of pixels; test voltage applying units that are disposed at the read-out signal lines and apply test voltages of various voltage levels to the read-out signal lines; a reference voltage generating circuit that includes a MOS transistor used for generating a reference voltage and can change an operating point of the MOS transistor; and an operating point control unit that controls a process of adjusting the operating point of the MOS transistor based on the test voltages and the reference voltage.