Invention Grant
US08742343B2 Charged particle beam system and method of axial alignment of charged particle beam 有权
带电粒子束系统和带电粒子束轴向对准的方法

  • Patent Title: Charged particle beam system and method of axial alignment of charged particle beam
  • Patent Title (中): 带电粒子束系统和带电粒子束轴向对准的方法
  • Application No.: US13908345
    Application Date: 2013-06-03
  • Publication No.: US08742343B2
    Publication Date: 2014-06-03
  • Inventor: Mitsuru YamadaMotohiro Nakamura
  • Applicant: Jeol Ltd.
  • Applicant Address: JP Tokyo
  • Assignee: Jeol Ltd.
  • Current Assignee: Jeol Ltd.
  • Current Assignee Address: JP Tokyo
  • Agency: The Webb Law Firm
  • Priority: JP2012-127049 20120604
  • Main IPC: H01J37/26
  • IPC: H01J37/26
Charged particle beam system and method of axial alignment of charged particle beam
Abstract:
A method of axially aligning a charged particle beam involves an image data acquisition step and a calculation step. The image data acquisition step consists of obtaining first to third sets of image data by scanning a shielding member placed in the path of the beam with the beam while varying conditions of the excitation currents through first and second alignment coils, respectively. The calculation step consists of calculating the values of the excitation currents through the first and second alignment coils, respectively, for axial alignment of the beam, based on the obtained first to third sets of image data.
Information query
Patent Agency Ranking
0/0