Invention Grant
US08742343B2 Charged particle beam system and method of axial alignment of charged particle beam
有权
带电粒子束系统和带电粒子束轴向对准的方法
- Patent Title: Charged particle beam system and method of axial alignment of charged particle beam
- Patent Title (中): 带电粒子束系统和带电粒子束轴向对准的方法
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Application No.: US13908345Application Date: 2013-06-03
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Publication No.: US08742343B2Publication Date: 2014-06-03
- Inventor: Mitsuru Yamada , Motohiro Nakamura
- Applicant: Jeol Ltd.
- Applicant Address: JP Tokyo
- Assignee: Jeol Ltd.
- Current Assignee: Jeol Ltd.
- Current Assignee Address: JP Tokyo
- Agency: The Webb Law Firm
- Priority: JP2012-127049 20120604
- Main IPC: H01J37/26
- IPC: H01J37/26

Abstract:
A method of axially aligning a charged particle beam involves an image data acquisition step and a calculation step. The image data acquisition step consists of obtaining first to third sets of image data by scanning a shielding member placed in the path of the beam with the beam while varying conditions of the excitation currents through first and second alignment coils, respectively. The calculation step consists of calculating the values of the excitation currents through the first and second alignment coils, respectively, for axial alignment of the beam, based on the obtained first to third sets of image data.
Public/Granted literature
- US20130320210A1 Charged Particle Beam System and Method of Axial Alignment of Charged Particle Beam Public/Granted day:2013-12-05
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