Invention Grant
- Patent Title: Scanning electron microscope device, evaluation point generating method, and program
- Patent Title (中): 扫描电子显微镜装置,评价点生成方法和程序
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Application No.: US13322394Application Date: 2010-05-25
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Publication No.: US08742375B2Publication Date: 2014-06-03
- Inventor: Takahiro Kawasaki
- Applicant: Takahiro Kawasaki
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: McDermott Will & Emery LLP
- Priority: JP2009-126939 20090526
- International Application: PCT/JP2010/058823 WO 20100525
- International Announcement: WO2010/137586 WO 20101202
- Main IPC: H01J37/26
- IPC: H01J37/26 ; G01N23/00

Abstract:
An image acquisition condition necessary to so arrange FOV's as not to overlap along a device shape so that all constituent arreas necessary for electric characteristic measurement may be confined in the FOV's is determined from device shape information (including circuit design data and layout design data) possessed by CAD data. Since, contingently upon the shape of a wiring portion, the wiring portion of a device is expressed by using a plurality of basic constituent figures in combination, a process of arranging FOV's to the individual constituent figures is executed. For a cell portion, a FOV is arranged in reference to a cell outer frame and apexes. At that time, any apex is a starting point of the FOV arrangement process and another apex is an end point of the same process.
Public/Granted literature
- US20120104251A1 SCANNING ELECTRON MICROSCOPE DEVICE, EVALUATION POINT GENERATING METHOD, AND PROGRAM Public/Granted day:2012-05-03
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