Invention Grant
US08742462B2 Integrated circuit including cross-coupled transistors having gate electrodes formed within gate level feature layout channels with gate contact position specifications
有权
集成电路包括交叉耦合晶体管,其栅极电极形成在具有栅极接触位置规格的栅极级特征布局通道内
- Patent Title: Integrated circuit including cross-coupled transistors having gate electrodes formed within gate level feature layout channels with gate contact position specifications
- Patent Title (中): 集成电路包括交叉耦合晶体管,其栅极电极形成在具有栅极接触位置规格的栅极级特征布局通道内
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Application No.: US12754103Application Date: 2010-04-05
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Publication No.: US08742462B2Publication Date: 2014-06-03
- Inventor: Scott T. Becker , Jim Mali , Carole Lambert
- Applicant: Scott T. Becker , Jim Mali , Carole Lambert
- Applicant Address: US CA Los Gatos
- Assignee: Tela Innovations, Inc.
- Current Assignee: Tela Innovations, Inc.
- Current Assignee Address: US CA Los Gatos
- Agency: Martine Penilla Group, LLP
- Main IPC: H01L27/10
- IPC: H01L27/10 ; H01L27/02 ; H01L27/088 ; H01L27/092

Abstract:
First and second PMOS transistors are defined over first and second p-type diffusion regions. First and second NMOS transistors are defined over first and second n-type diffusion regions. Each diffusion region is electrically connected to a common node. Gate electrodes are formed from conductive features that are each defined within any one gate level channel that is uniquely associated with and defined along one of a number of parallel gate electrode tracks. At least a portion of each of the first and second p-type diffusion regions are formed over a first common line of extent that extends perpendicular to the first parallel direction. The first and second n-type diffusion regions are formed in a spaced apart manner relative to the first parallel direction, such that no single line of extent that extends across the substrate perpendicular to the first parallel direction intersects both the first and second n-type diffusion regions.
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