Invention Grant
- Patent Title: Charge compensation semiconductor device
- Patent Title (中): 充电补偿半导体器件
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Application No.: US13541884Application Date: 2012-07-05
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Publication No.: US08742550B2Publication Date: 2014-06-03
- Inventor: Hans Weber , Franz Hirler
- Applicant: Hans Weber , Franz Hirler
- Applicant Address: AT Villach
- Assignee: Infineon Technologies Austria AG
- Current Assignee: Infineon Technologies Austria AG
- Current Assignee Address: AT Villach
- Agency: Murphy, Bilak & Homiller, PLLC
- Main IPC: H01L21/02
- IPC: H01L21/02

Abstract:
A semiconductor device is provided. The semiconductor device includes a semiconductor body and a source metallization which is arranged on the semiconductor body. The semiconductor body includes in a cross-section a drift region of a first conductivity type, a first body region of a second conductivity type which adjoins the drift region, a first compensation region of the second conductivity type which adjoins the first body region, has a lower maximum doping concentration than the first body region and forms a first pn-junction with the drift region, and a first charge trap. The first charge trap adjoins the first compensation region and includes a field plate and an insulating region which adjoins the drift region and partly surrounds the field plate. The source metallization is arranged in resistive electric connection with the first body region. Further, a method for producing a semiconductor device is provided.
Public/Granted literature
- US20140008717A1 Charge Compensation Semiconductor Device Public/Granted day:2014-01-09
Information query
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